myProject™

Click on the "PAR Number" to view the most current PAR information. The "Original PAR URL" shows the PAR as it was originally approved.
Sponsor PAR Number Title Original PAR URL PAR Approval
C/SAB P2842 Recommended Practice for Secure Multi-party Computation https://development.standards.ieee.org/get-file/P2842.pdf?t=101987500003
C/SAB P2888.1 Specification of Sensor Interface for Cyber and Physical World https://development.standards.ieee.org/get-file/P2888.1.pdf?t=101987800003
C/SAB P3079 Standard for Head Mounted Display (HMD) Based Virtual Reality (VR) Sickness Reduction Technology https://development.standards.ieee.org/get-file/P3079.pdf?t=96996800003
C/SAB P3333.1.3 Standard for the Deep Learning-Based Assessment of Visual Experience Based on Human Factors https://development.standards.ieee.org/get-file/P3333.1.3.pdf?t=94649700003
C/SI P1516 Standard for Modeling and Simulation (M&S) High Level Architecture (HLA)-- Framework and Rules https://development.standards.ieee.org/get-file/P1516.pdf?t=88534900003
C/SI P1516.1 Standard for Modeling and Simulation (M&S) High Level Architecture (HLA)-- Federate Interface Specification https://development.standards.ieee.org/get-file/P1516.1.pdf?t=88535200003
C/SI P1516.2 Standard for Modeling and Simulation (M&S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification https://development.standards.ieee.org/get-file/P1516.2.pdf?t=88535500003
C/SI P1730.2 Recommended Practice for Verification, Validation and Accreditation of a Distributed Simulation - an Overlay to the Distributed Simulation Engineering and Execution Process https://development.standards.ieee.org/get-file/P1730.2.pdf?t=97016900003
C/TT P1149.7 Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture https://development.standards.ieee.org/get-file/P1149.7.pdf?t=102009900003
C/TT P1500 Standard Testability Method for Embedded Core-based Integrated Circuits https://development.standards.ieee.org/get-file/P1500.pdf?t=102010200003
C/TT P1687.1 Standard for the Application of Interfaces and Controllers to Access 1687 IJTAG Networks Embedded Within Semiconductor Devices https://development.standards.ieee.org/get-file/P1687.1.pdf?t=91649000003
C/TT P1687.2 Standard for Describing Analog Test Access and Control https://development.standards.ieee.org/get-file/P1687.2.pdf?t=96018700003
C/TT P1838 Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits https://development.standards.ieee.org/get-file/P1838.pdf?t=64029200003
C/TT P2427 Standard for Analog Defect Modeling and Coverage https://development.standards.ieee.org/get-file/P2427.pdf?t=96019000003
C/TT P2654 Standard for System Test Access Management (STAM) to Enable Use of Sub-System Test Capabilities at Higher Architectural Levels https://development.standards.ieee.org/get-file/P2654.pdf?t=98741400003

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myProject is the Standard Association's tool to allow you to better manage and keep up to date on projects and topics that you are interested in.